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Latest Scanning System Tenders in Japan 2025

JapanTenders brings you the latest and most relevant Scanning System tenders in Japan, sourced directly from reliable government portals, purchaser websites, and leading procurement publications. Whether you're a supplier, contractor, or manufacturer, we ensure you stay informed about ongoing bidding opportunities without missing a beat.

Our platform is regularly updated with tenders related to Scanning System and other keywords tenders. Each listing includes key details such as tender reference numbers, submission deadlines, and purchaser information helping you make informed bidding decisions quickly and confidently.

By subscribing to JapanTenders, users gain unlimited access to public procurement notices related to Scanning System. Our tools also offer category-based filtering, email alerts, and quick tender downloads, making your bidding process faster and more efficient. Stay ahead of the competition and grow your business by exploring verified tenders from both government and private entities across Japan.

Cryogenic focused ion beam scanning electron microscopy system 1 set

JPT Ref No.:  130419647

Deadline:  10 Dec 2025

Field Emission Scanning Electron Microscope System 1 Set

JPT Ref No.:  126063761

Deadline:  04 Nov 2025

Confocal Laser Scanning Microscope System 1 Set

JPT Ref No.:  126063754

Deadline:  14 Nov 2025

Super resolution confocal laser scanning microscope system 1 set

JPT Ref No.:  126063738

Deadline:  04 Nov 2025

Focused Ion Beam & Scanning Electron Microscope system (FIBSEM) 1 Set

JPT Ref No.:  125866605

Deadline:  31 Oct 2025

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