- Country: Japan
- Summary: Frozen Sample Focused Ion Beam Scanning Microscope System
- JPT Ref No: 132684223
- Deadline: 08 Jan 2026
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.:
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- Description:
- Frozen sample focused ion beam scanning microscope system Description: Frozen sample focused ion beam scanning microscope system Purchase of goods, etc. Return to the list of purchase of goods, etc. Procurement project name Frozen sample focused ion beam scanning microscope system Procurement form Publication date Bid deadline Date Bid opening date Procurement department Government procurement 2025 December... Deadline: 2026-01-08 [Disclaimer: This notice does not specify a specific deadline, so we have added 15 days from the date of posting]
- Documents:
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CLICK HERE TO LOGINFrozen Sample Focused Ion Beam Scanning Microscope System - Japan Tender
The NATIONAL RESEARCH AND DEVELOPMENT AGENCY RIKEN, a Government sector organization in Japan, has announced a new tender for Frozen Sample Focused Ion Beam Scanning Microscope System. This tender is published on JapanTenders under JPT Ref No: 132684223 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2026-01-08.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
