- Country: Japan
- Summary: X-Ray Diffraction Device for Thin Film Crystal Evaluation
- JPT Ref No: 119501347
- Deadline: 04 Jun 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.:
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- Description:
- X-ray diffraction device for thin film crystal evaluation - Description: X-ray diffraction device for thin film crystal evaluation - X-ray diffraction device for thin film crystal evaluation - AIST: Procurement information Large classification Government procurement classification bid announcement Subject of Kansai Center, Tsukuba Center, Tokyo Headquarters Subject of Thin Film...
Deadline: 2025-06-04
[Disclaimer: No specific deadline is specified for this notice, so 15 days have been added from the date of posting] - Documents:
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CLICK HERE TO LOGINX-Ray Diffraction Device for Thin Film Crystal Evaluation - Japan Tender
The NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, a Government sector organization in Japan, has announced a new tender for X-Ray Diffraction Device for Thin Film Crystal Evaluation. This tender is published on JapanTenders under JPT Ref No: 119501347 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-06-04.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
