- Country: Japan
- Summary: Physical Analysis of Defective Bias Current Setting Circuit of Multi-Element X-Ray Energy Analysis Cmos Sensor
- JPT Ref No: 77220573
- Deadline: 25 Jan 2023
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.:
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- Description:
- Physical Analysis of Bias Current Setting Circuit Defects in Multi-element X-ray Energy Analysis CMOS Sensors -Description : Physical Analysis of Bias Current Setting Circuit Defects in Multi-element X-ray Energy Analysis CMOS Sensors-Provision of ServicesReturn to List of Provision of Services Project name Problem related to bias current setting circuit failure of multi-element X-ray energy analysis CMOS sensor...f440f9c4f72e9d5fe621695863997fbf
- Documents:
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CLICK HERE TO LOGINPhysical Analysis of Defective Bias Current Setting Circuit of Multi-Element X-Ray Energy Analysis Cmos Sensor - Japan Tender
The NATIONAL RESEARCH AND DEVELOPMENT AGENCY RIKEN, a Government sector organization in Japan, has announced a new tender for Physical Analysis of Defective Bias Current Setting Circuit of Multi-Element X-Ray Energy Analysis Cmos Sensor. This tender is published on JapanTenders under JPT Ref No: 77220573 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2023-01-25.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
