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Latest Scanning Electron Microscope Tenders in Japan 2026

JapanTenders brings you the latest and most relevant Scanning Electron Microscope tenders in Japan, sourced directly from reliable government portals, purchaser websites, and leading procurement publications. Whether you're a supplier, contractor, or manufacturer, we ensure you stay informed about ongoing bidding opportunities without missing a beat.

Our platform is regularly updated with tenders related to Scanning Electron Microscope and other keywords tenders. Each listing includes key details such as tender reference numbers, submission deadlines, and purchaser information helping you make informed bidding decisions quickly and confidently.

By subscribing to JapanTenders, users gain unlimited access to public procurement notices related to Scanning Electron Microscope. Our tools also offer category-based filtering, email alerts, and quick tender downloads, making your bidding process faster and more efficient. Stay ahead of the competition and grow your business by exploring verified tenders from both government and private entities across Japan.

Focused Ion Beam & Scanning Electron Microscope System (Fibsem) 1 Set

JPT Ref No.:  121854563

Deadline:  22 Jul 2025

Focused Ion Beam Scanning Electron Microscope System

JPT Ref No.:  121429089

Deadline:  08 Jul 2025

Field Emission Scanning Electron Microscope 1 Set

JPT Ref No.:  120543796

Deadline:  30 Jun 2025

Scanning Electron Microscope Set

JPT Ref No.:  120443338

Deadline:  20 Jun 2025

Field Emission Scanning Electron Microscope 1Set

JPT Ref No.:  120429691

Deadline:  28 Jul 2025

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